X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution

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Holler , M , Diaz , A , Guizar-Sicairos , M , Karvinen , P , Färm , E , Härkönen , E , Ritala , M , Menzel , A , Raabe , J & Bunk , O 2014 , ' X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution ' , Scientific Reports , vol. 4 , 3857 . https://doi.org/10.1038/srep03857

Title: X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution
Author: Holler, M.; Diaz, A.; Guizar-Sicairos, M.; Karvinen, P.; Färm, Elina; Härkönen, Emma; Ritala, Mikko; Menzel, A.; Raabe, J.; Bunk, O.
Contributor: University of Helsinki, Department of Chemistry
University of Helsinki, Department of Chemistry
University of Helsinki, Department of Chemistry
Date: 2014-01-24
Language: eng
Number of pages: 5
Belongs to series: Scientific Reports
ISSN: 2045-2322
URI: http://hdl.handle.net/10138/162565
Subject: ATOMIC LAYER DEPOSITION
PHASE RETRIEVAL
DIFFRACTION MICROSCOPY
ALGORITHMS
NANOSCALE
PILATUS
114 Physical sciences
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