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http://hdl.handle.net/10138/162565

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Holler , M , Diaz , A , Guizar-Sicairos , M , Karvinen , P , Färm , E , Härkönen , E , Ritala , M , Menzel , A , Raabe , J & Bunk , O 2014 , ' X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution ' , Scientific Reports , vol. 4 , 3857 . https://doi.org/10.1038/srep03857

Title:	X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution
Author:	Holler, M.; Diaz, A.; Guizar-Sicairos, M.; Karvinen, P.; Färm, Elina; Härkönen, Emma; Ritala, Mikko; Menzel, A.; Raabe, J.; Bunk, O.
Contributor organization:	Department of Chemistry Mikko Ritala / Principal Investigator
Date:	2014-01-24
Language:	eng
Number of pages:	5
Belongs to series:	Scientific Reports
ISSN:	2045-2322
DOI:	https://doi.org/10.1038/srep03857
URI:	http://hdl.handle.net/10138/162565
Subject:	ATOMIC LAYER DEPOSITION PHASE RETRIEVAL DIFFRACTION MICROSCOPY ALGORITHMS NANOSCALE PILATUS 114 Physical sciences
Peer reviewed:	Yes
Rights:	cc_by
Usage restriction:	openAccess
Self-archived version:	publishedVersion



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