Defects in bilayer silica and graphene: common trends in diverse hexagonal two-dimensional systems

Show full item record



Permalink

http://hdl.handle.net/10138/162577

Citation

Bjorkman , T , Kurasch , S , Lehtinen , O , Kotakoski , J , Yazyev , O V , Srivastava , A , Skakalova , V , Smet , J H , Kaiser , U & Krasheninnikov , A V 2013 , ' Defects in bilayer silica and graphene: common trends in diverse hexagonal two-dimensional systems ' , Scientific Reports , vol. 3 , 3482 . https://doi.org/10.1038/srep03482

Title: Defects in bilayer silica and graphene: common trends in diverse hexagonal two-dimensional systems
Author: Bjorkman, Torbjorn; Kurasch, Simon; Lehtinen, Ossi; Kotakoski, Jani; Yazyev, Oleg V.; Srivastava, Anchal; Skakalova, Viera; Smet, Jurgen H.; Kaiser, Ute; Krasheninnikov, Arkady V.
Contributor: University of Helsinki, Department of Physics
University of Helsinki, Department of Physics
Date: 2013-12-16
Language: eng
Number of pages: 7
Belongs to series: Scientific Reports
ISSN: 2045-2322
URI: http://hdl.handle.net/10138/162577
Subject: AUGMENTED-WAVE METHOD
GRAIN-BOUNDARIES
MOLYBDENUM-DISULFIDE
ATOMIC-STRUCTURE
TRANSITION
DISLOCATIONS
GROWTH
METALS
CARBON
GLASS
114 Physical sciences
Rights:


Files in this item

Total number of downloads: Loading...

Files Size Format View
srep03482.pdf 4.191Mb PDF View/Open

This item appears in the following Collection(s)

Show full item record