Directional Sensitivity in Light-Mass Dark Matter Searches with Single-Electron-Resolution Ionization Detectors

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Kadribasic , F , Mirabolfathi , N , Nordlund , K , Sand , A E , Holmström , E & Djurabekova , F 2018 , ' Directional Sensitivity in Light-Mass Dark Matter Searches with Single-Electron-Resolution Ionization Detectors ' , Physical Review Letters , vol. 120 , no. 11 , 111301 . https://doi.org/10.1103/PhysRevLett.120.111301

Title: Directional Sensitivity in Light-Mass Dark Matter Searches with Single-Electron-Resolution Ionization Detectors
Author: Kadribasic, Fedja; Mirabolfathi, Nader; Nordlund, Kai; Sand, Andrea E.; Holmström, Eero; Djurabekova, Flyura
Contributor: University of Helsinki, Department of Physics
University of Helsinki, Department of Physics
University of Helsinki, Department of Physics
University of Helsinki, Department of Physics
Date: 2018-03-16
Language: eng
Number of pages: 5
Belongs to series: Physical Review Letters
ISSN: 0031-9007
URI: http://hdl.handle.net/10138/233971
Abstract: We propose a method using solid state detectors with directional sensitivity to dark matter interactions to detect low-mass weakly interacting massive particles (WIMPs) originating from galactic sources. In spite of a large body of literature for high-mass WIMP detectors with directional sensitivity, no available technique exists to cover WIMPs in the mass range <1 GeV/c(2). We argue that single-electron-resolution semiconductor detectors allow for directional sensitivity once properly calibrated. We examine the commonly used semiconductor material response to these low-mass WIMP interactions.
Subject: SIMULATION
114 Physical sciences
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