Group refractive index quantification using a Fourier domain short coherence Sagnac interferometer

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Montonen , R , Kassamakov , I , Lehmann , P , Österberg , K & Haeggström , E 2018 , ' Group refractive index quantification using a Fourier domain short coherence Sagnac interferometer ' , Optics Letters , vol. 43 , no. 4 , pp. 887-890 . https://doi.org/10.1364/OL.43.000887

Title: Group refractive index quantification using a Fourier domain short coherence Sagnac interferometer
Author: Montonen, Risto; Kassamakov, Ivan; Lehmann, Peter; Österberg, Kenneth; Haeggström, Edward
Contributor: University of Helsinki, Helsinki Institute of Physics
University of Helsinki, Department of Physics
University of Helsinki, Department of Physics
University of Helsinki, Department of Physics
Date: 2018-02-15
Language: eng
Number of pages: 4
Belongs to series: Optics Letters
ISSN: 0146-9592
URI: http://hdl.handle.net/10138/307965
Abstract: The group refractive index is important in length calibration of Fourier domain interferometers by transparent transfer standards. We demonstrate accurate group refractive index quantification using a Fourier domain short coherence Sagnac interferometer. Because of a justified linear length calibration function, the calibration constants cancel out in the evaluation of the group refractive index, which is then obtained accurately from two uncalibrated lengths. Measurements of two standard thickness coverslips revealed group indices of 1.5426 +/- 0.0042 and 1.5434 +/- 0.0046, with accuracies quoted at the 95% confidence level. This agreed with the dispersion data of the coverslip manufacturer and therefore validates our method. Our method provides a sample specific and accurate group refractive index quantification using the same Fourier domain interferometer that is to be calibrated for the length. This reduces significantly the requirements of the calibration transfer standard. (C) 2018 Optical Society of America
Subject: THIN-FILMS
THICKNESS
PHASE
SPECTROSCOPY
MODULATION
CONVERSION
PRESSURE
SYSTEM
114 Physical sciences
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