Label-free 3D super-resolution nanoscope with large field of view

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http://hdl.handle.net/10138/312072

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Kassamakov , I , Ylitalo , T , Nolvi , A , Raatikainen , P , Paananen , R & Haeggström , E 2019 , Label-free 3D super-resolution nanoscope with large field of view . in YG Soskind (ed.) , Optical Measurement Systems for Industrial Inspection XI . , 109250A , Proceedings of SPIE , vol. 10925 , SPIE - the international society for optics and photonics , Conference on Photonic Instrumentation Engineering , San Francisco , Canada , 05/02/2019 . https://doi.org/10.1117/12.2505622

Title: Label-free 3D super-resolution nanoscope with large field of view
Author: Kassamakov, Ivan; Ylitalo, Tuomo; Nolvi, Anton; Raatikainen, Pekka; Paananen, Riku; Haeggström, Edward
Other contributor: University of Helsinki, Department of Physics
University of Helsinki, Materials Physics
University of Helsinki, Department of Physics
University of Helsinki, Department of Physics
Soskind, YG

Publisher: SPIE - the international society for optics and photonics
Date: 2019
Language: eng
Number of pages: 8
Belongs to series: Optical Measurement Systems for Industrial Inspection XI
Belongs to series: Proceedings of SPIE
ISBN: 978-1-5106-2493-1
DOI: https://doi.org/10.1117/12.2505622
URI: http://hdl.handle.net/10138/312072
Abstract: Photonic nanojet interferometry (PM) permits three dimensional (3D) label-free and super-resolution surface characterization. PM is based on coherence scanning interferometry (CSI), featuring Angstrom level vertical resolution. Being an optical far-field technique, CSI is diffraction limited and according to the Abbe criteria, can laterally resolve, points that are separated by a few hundred nanometers. We overcame this limitation by using dielectric microspheres that generate photonic nanojets. Now sub 100 nm features can laterally be resolved while preserving the vertical resolution of the CSI system. The microsphere material could be polymer or glass with a diameter between 8 and 12 mu m, which limits the field of view (FoV) of the PNI system to similar to 10 mu m(2). Here we present a method to increase the FoV of a PNI based device by stitching a sequence of adjacent 3D images. We imaged a recordable Blu-ray Disc (BR-D) using a custom built Mirau type scanning white light interferometer with enhanced lateral resolution. Four 3D super-resolution images with constant 80% overlap, were stitched together using in-house software. The resulting high fidelity image shows that 45% overlap and the above described procedure could be used to enlarge the FoV of label-free 3D super-resolution imaging systems.
Subject: Label-free 3D super-resolution
nanoscopy
stitching
RESOLUTION
LIGHT
114 Physical sciences
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