Simulation Tools for Atom Probe Tomography : A Path For Diagnosis and Treatment of Image Degradation

Show simple item record Vurpillot, Francois Parviainen, Stefan Djurabekova, Flyura Zanuttini, David Gervais, Benoit 2020-04-19T00:23:38Z 2021-12-17T22:02:13Z 2018-12
dc.identifier.citation Vurpillot , F , Parviainen , S , Djurabekova , F , Zanuttini , D & Gervais , B 2018 , ' Simulation Tools for Atom Probe Tomography : A Path For Diagnosis and Treatment of Image Degradation ' , Materials Characterization , vol. 146 , pp. 336-346 .
dc.identifier.other PURE: 98301836
dc.identifier.other PURE UUID: e2e43276-2642-4433-82e4-bb6e15a5a767
dc.identifier.other Scopus: 85046121230
dc.identifier.other WOS: 000452816700032
dc.identifier.other ORCID: /0000-0002-5828-200X/work/52692060
dc.description.abstract The ideal picture of a near-perfect 3D microscope often presented regarding Atom Probe Tomography faces several issues. These issues degrade the metrological performance of the instrument and find their roots in the phenomena acting at the atomic to the mesoscopic level in the vicinity of the surface of a field emitter. From the field evaporation process at the atomic scale, to the macroscopic scale of the instrument, the path to model the imaging process and to develop more accurate and reliable reconstruction algorithms is not a single lane road. This paper focused on the numerical methods used to understand, treat, and potentially heal imaging issues commonly affecting the data in atom probe experiments. A lot of room for improvement exists in solving accuracy problems observed in complex materials by means of purely electrostatic models describing the image formation in a classical approach. Looking at the sample at the atomic scale, the phenomena perturbing the imaging process are subtle. An examination of atomic scale modifications of the sample surface in the presence of a high surface electric field is therefore mandatory. Atomic scale molecular dynamic models integrating the influence of the high surface electric are being developed with this aim. It is also demonstrated that the complex behavior of atoms and molecules in high fields, and consequences on collected data, can be understood through the use of accurate ab-initio models modified to include the impact of the extreme surface electric field. en
dc.format.extent 11
dc.language.iso eng
dc.relation.ispartof Materials Characterization
dc.rights cc_by_nc_nd
dc.rights.uri info:eu-repo/semantics/openAccess
dc.subject 114 Physical sciences
dc.subject Atom Probe Tomography, APT
dc.subject Computer atomistic simulations
dc.subject High electric field effects
dc.subject Atom probe tomography
dc.subject Modeling approaches
dc.subject Molecular dynamic
dc.subject Ab-initio
dc.subject Nano-metrology
dc.subject MICROSCOPY
dc.subject RESOLUTION
dc.subject EVOLUTION
dc.subject EVENTS
dc.subject PHASE
dc.title Simulation Tools for Atom Probe Tomography : A Path For Diagnosis and Treatment of Image Degradation en
dc.type Review Article
dc.contributor.organization Helsinki Institute of Physics
dc.contributor.organization Department of Physics
dc.description.reviewstatus Peer reviewed
dc.relation.issn 1044-5803
dc.rights.accesslevel openAccess
dc.type.version acceptedVersion

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