Electrical Impedance Tomography, Enclosure Method and Machine Learning

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Siltanen , S & Ide , T 2020 , Electrical Impedance Tomography, Enclosure Method and Machine Learning . in PROCEEDINGS OF THE 2020 IEEE 30TH INTERNATIONAL WORKSHOP ON MACHINE LEARNING FOR SIGNAL PROCESSING (MLSP) . IEEE International Workshop on Machine Learning for Signal Processing , IEEE , International Workshop on Machine Learning for Signal Processing , Espoo , Finland , 21/09/2020 . https://doi.org/10.1109/MLSP49062.2020.9231717

Title: Electrical Impedance Tomography, Enclosure Method and Machine Learning
Author: Siltanen, Samuli; Ide, Takanori
Contributor: University of Helsinki, Department of Mathematics and Statistics
Publisher: IEEE
Date: 2020-10-20
Language: eng
Number of pages: 6
Belongs to series: PROCEEDINGS OF THE 2020 IEEE 30TH INTERNATIONAL WORKSHOP ON MACHINE LEARNING FOR SIGNAL PROCESSING (MLSP)
Belongs to series: IEEE International Workshop on Machine Learning for Signal Processing
ISBN: 978-1-7281-6663-6
978-1-7281-6662-9
URI: http://hdl.handle.net/10138/327174
Subject: 113 Computer and information sciences
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