Siltanen , S & Ide , T 2020 , Electrical Impedance Tomography, Enclosure Method and Machine Learning . in PROCEEDINGS OF THE 2020 IEEE 30TH INTERNATIONAL WORKSHOP ON MACHINE LEARNING FOR SIGNAL PROCESSING (MLSP) . IEEE International Workshop on Machine Learning for Signal Processing , IEEE , International Workshop on Machine Learning for Signal Processing , Espoo , Finland , 21/09/2020 . https://doi.org/10.1109/MLSP49062.2020.9231717
Title: | Electrical Impedance Tomography, Enclosure Method and Machine Learning |
Author: | Siltanen, Samuli; Ide, Takanori |
Contributor organization: | Department of Mathematics and Statistics Inverse Problems Mikko Samuli Siltanen / Principal Investigator |
Publisher: | IEEE |
Date: | 2020-10-20 |
Language: | eng |
Number of pages: | 6 |
Belongs to series: | PROCEEDINGS OF THE 2020 IEEE 30TH INTERNATIONAL WORKSHOP ON MACHINE LEARNING FOR SIGNAL PROCESSING (MLSP) |
Belongs to series: | IEEE International Workshop on Machine Learning for Signal Processing |
ISBN: | 978-1-7281-6663-6 978-1-7281-6662-9 |
ISSN: | 2161-0363 |
DOI: | https://doi.org/10.1109/MLSP49062.2020.9231717 |
URI: | http://hdl.handle.net/10138/327174 |
Subject: | 113 Computer and information sciences |
Peer reviewed: | Yes |
Rights: | unspecified |
Usage restriction: | openAccess |
Self-archived version: | acceptedVersion |
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