Electrical Impedance Tomography, Enclosure Method and Machine Learning
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Siltanen , S & Ide , T 2020 , Electrical Impedance Tomography, Enclosure Method and Machine Learning . in PROCEEDINGS OF THE 2020 IEEE 30TH INTERNATIONAL WORKSHOP ON MACHINE LEARNING FOR SIGNAL PROCESSING (MLSP) . IEEE International Workshop on Machine Learning for Signal Processing , IEEE , International Workshop on Machine Learning for Signal Processing , Espoo , Finland , 21/09/2020 . https://doi.org/10.1109/MLSP49062.2020.9231717
| Title: | Electrical Impedance Tomography, Enclosure Method and Machine Learning |
| Author: | Siltanen, Samuli; Ide, Takanori |
| Contributor organization: | Department of Mathematics and Statistics Inverse Problems Mikko Samuli Siltanen / Principal Investigator |
| Publisher: | IEEE |
| Date: | 2020-10-20 |
| Language: | eng |
| Number of pages: | 6 |
| Belongs to series: | PROCEEDINGS OF THE 2020 IEEE 30TH INTERNATIONAL WORKSHOP ON MACHINE LEARNING FOR SIGNAL PROCESSING (MLSP) |
| Belongs to series: | IEEE International Workshop on Machine Learning for Signal Processing |
| ISBN: | 978-1-7281-6663-6 978-1-7281-6662-9 |
| ISSN: | 2161-0363 |
| DOI: | https://doi.org/10.1109/MLSP49062.2020.9231717 |
| URI: | http://hdl.handle.net/10138/327174 |
| Subject: | 113 Computer and information sciences |
| Peer reviewed: | Yes |
| Rights: | unspecified |
| Usage restriction: | openAccess |
| Self-archived version: | acceptedVersion |
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