An overview of nanoemulsion characterization via atomic force microscopy

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Ho , M T , Abik , F & Mikkonen , K S 2022 , ' An overview of nanoemulsion characterization via atomic force microscopy ' , Critical Reviews in Food Science and Nutrition , vol. 62 , no. 18 , pp. 4908-4928 . https://doi.org/10.1080/10408398.2021.1879727

Title: An overview of nanoemulsion characterization via atomic force microscopy
Author: Ho, Minh Thao; Abik, Felix; Mikkonen, Kirsi S.
Contributor organization: Department of Food and Nutrition
Food Materials Science Research Group
Helsinki Institute of Sustainability Science (HELSUS)
Date: 2022
Language: eng
Number of pages: 21
Belongs to series: Critical Reviews in Food Science and Nutrition
ISSN: 1040-8398
DOI: https://doi.org/10.1080/10408398.2021.1879727
URI: http://hdl.handle.net/10138/346073
Abstract: Nanoemulsion-based systems are widely applied in food industries for protecting active ingredients against oxidation and degradation and controlling the release rate of active core ingredients under particular conditions. Visualizing the interface morphology and measuring the interfacial interaction forces of nanoemulsion droplets are essential to tailor and design intelligent nanoemulsion-based systems. Atomic force microscopy (AFM) is being established as an important technique for interface characterization, due to its unique advantages over traditional imaging and surface force-determining approaches. However, there is a gap in knowledge about the applicability of AFM in characterizing the droplet interface properties of nanoemulsions. This review aims to describe the fundamentals of the AFM technique and nanoemulsions, mainly focusing on the recent use of AFM to investigate nanoemulsion properties. In addition, by reviewing interfacial studies on emulsions in general, perspectives for the further development of AFM to study nanoemulsions are also discussed.
Subject: 416 Food Science
Nanoemulsion
interface
atomic force microscopy
Nanoemulsion
interfacial characterization
atomic force microscopy
surface force
Peer reviewed: Yes
Rights: cc_by
Usage restriction: openAccess
Self-archived version: publishedVersion


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