TY  -  
T1  - Simulation Tools for Atom Probe Tomography : A Path For Diagnosis and Treatment of Image Degradation 
SN  -  /  
UR  - http://hdl.handle.net/10138/314176 
T3  -  
A1  - Vurpillot, Francois; Parviainen, Stefan; Djurabekova, Flyura; Zanuttini, David; Gervais, Benoit 
A2  -  
PB  -  
Y1  - 2018 
LA  - eng 
AB  - The ideal picture of a near-perfect 3D microscope often presented regarding Atom Probe Tomography faces several issues. These issues degrade the metrological performance of the instrument and find their roots in the phenomena acting at the atomic to the mesoscopic level in the vicinity of the surface of a field emitter. From the field evaporation process at the atomic scale, to the macroscopic scale of the instrument, the path to model the imaging process and to develop more accurate and reliabl... 
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KW  - 114 Physical sciences; Atom Probe Tomography, APT; Computer atomistic simulations; High electric field effects; Atom probe tomography; Modeling approaches; Molecular dynamic; Ab-initio; Nano-metrology; FIELD EVAPORATION BEHAVIOR; MICROSCOPY; RECONSTRUCTION; RESOLUTION; EVOLUTION; EVENTS; PHASE 
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