Cadmium Telluride X-ray pad detectors with different passivation dielectrics

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dc.contributor.author Gädda, Akiko
dc.contributor.author Ott, Jennifer
dc.contributor.author Karadzhinova-Ferrer, Aneliya
dc.contributor.author Golovleva, Maria
dc.contributor.author Kalliokoski, Matti
dc.contributor.author Winkler, Alexander
dc.contributor.author Luukka, Panja
dc.contributor.author Härkönen, Jaakko
dc.date.accessioned 2021-03-19T22:43:46Z
dc.date.available 2021-12-17T22:00:37Z
dc.date.issued 2019-04-21
dc.identifier.citation Gädda , A , Ott , J , Karadzhinova-Ferrer , A , Golovleva , M , Kalliokoski , M , Winkler , A , Luukka , P & Härkönen , J 2019 , ' Cadmium Telluride X-ray pad detectors with different passivation dielectrics ' , Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment , vol. 924 , pp. 33-37 . https://doi.org/10.1016/j.nima.2018.08.063
dc.identifier.other PURE: 116083640
dc.identifier.other PURE UUID: 5f0cac82-007d-48d3-a20f-7cb8fe29ef55
dc.identifier.other Scopus: 85052741684
dc.identifier.other WOS: 000461827900008
dc.identifier.other ORCID: /0000-0001-9337-5722/work/56405721
dc.identifier.other ORCID: /0000-0002-4786-0134/work/56405724
dc.identifier.other ORCID: /0000-0002-4963-0121/work/84257684
dc.identifier.uri http://hdl.handle.net/10138/328224
dc.description.abstract The suitability of two low-temperature dielectric passivation layer processes for the fabrication of Cadmium Telluride (CdTe) X-ray detectors has been investigated. The CdTe crystals with a size of (10 10 1) mm were coated with sputtered aluminum nitride (AlN) or with aluminum oxide (AlO) grown by the atomic layer deposition (ALD) method. The metallization contacts of the detectors were made by titanium tungsten (TiW) and gold (Au) metal sputtering depositions. The pad detector structures were patterned with proximity-contactless photolithography techniques followed by lift-off patterning of the electrodes. The detector properties were characterized at room temperature by Transient Current Technique (TCT) measurements. The obtained results were compared and verified by numerical TCAD simulations of the detector response. Our results indicate that higher signal charge was collected from samples with AlO. Furthermore, no significant laser light induced signal decay by CdTe material polarization was observed within order of 30 min of continuous illumination. en
dc.format.extent 5
dc.language.iso eng
dc.relation.ispartof Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
dc.rights cc_by_nc_nd
dc.rights.uri info:eu-repo/semantics/openAccess
dc.subject 114 Physical sciences
dc.subject Cadmium Telluride (CdTe)
dc.subject Atomic layer deposition (ALD)
dc.subject X-ray detector
dc.subject LAYER DEPOSITION ALD
dc.subject CDTE
dc.subject AL2O3
dc.subject PROGRESS
dc.subject FIELD
dc.subject SI
dc.title Cadmium Telluride X-ray pad detectors with different passivation dielectrics en
dc.type Article
dc.contributor.organization Helsinki Institute of Physics
dc.contributor.organization Doctoral Programme in Particle Physics and Universe Sciences
dc.description.reviewstatus Peer reviewed
dc.relation.doi https://doi.org/10.1016/j.nima.2018.08.063
dc.relation.issn 0168-9002
dc.rights.accesslevel openAccess
dc.type.version acceptedVersion

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